AT-PMU is a high performance and high parallelism I-V source/measure instrument for use as either bench-top I-V characterization tool or as a building block for complex semiconductor device characterization.
AT-PMU features a high parallelism architecture with integrated switch matrix combined with high sampling rate and high precision measurement units that make this instrument an unrival test solution for parallel test execution.
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QUICK AND EASY LAB USE
For lab or bench-top use AT-PMU offers a high performance complete I-V measurement solution with unrival ease-of-use, precision and speed.
Thanks to the high parallelism (2 or 8 I-V Measurement Units) and to the integrated switch matrix up to 16 I-V characteristics can be quickly evaluated without rewiring.
The high sampling rate (65MSamples/s) together with the programmable hardware averaging provide the user with the possibility to tune between measurement speed and precision. Thanks to its low parasitic architecture AT-PMU has 10x to 100x better measurement precision than competitors provided the same measurement time or 10x to 100x faster measurement time than competitors provided the same precision.
A intuitive graphical user interface provides a quick setup and advanced tests for device characterization applications. The data can be viewed in graphical or tabular formats and can be readily exported in a .csv file.
COMPLEX TEST SYSTEM USE
The peculiarity of the AT-PMU is its tight integration with external instruments to make a complete test system aimed at complex semiconductor device characterization.
Thanks to the flexibility of its integrated Switch Matrix the AT-PMU can quickly place each of its I/O pins in series or in parallel with external instruments without the need of rewiring. This way its high performance source/measurement resources can be shared among all channels.
High measurement throughputs can be sustained thanks to the high sampling rate (65MSamples/s) and to the two possible data storage and transfer strategies: the “on the go” and the “oscilloscope like” strategies.
In the “on the go” strategy a 2kSample dual port memory is used to store new measurement bursts at the same time while the already stored measurements can be transferred to a mass storage device. A continuous acquisition process can be sustained through the high speed USB 2.0 connection to the PC.
In the “oscilloscope like” strategy a huge 1MSample single port memory can store with continuity large measurement amounts. The memory is read back at once when the acquisition process is stopped.
For system level applications .Net C++ libraries and LabVIEW VIs allow easy but efficient instrument control and tight integration with external instruments to execute complete test programs.
SINCHRONIZATION AND PARALLEL TEST CAPABILITIES
Thanks to the AT-XSS bus up to 8 AT-PMU instruments can be connected in master-slave configuration providing so up to 128 I/O and 64 parallel Measurement Units.
Tight timing synchronization is ensured by the AT-XSS synchronous trigger lines.
THE I-V MEASUREMENT UNIT
Each instrument has 2 parallel Voltage Sources and 2 parallel Current Sources that can be shared among all channels. Each I-V MU provides:
- 12 Bit or 14 Bit resolution
- 65 MSamples/s max sampling frequency
- 2 kSamples Dual Port memory for “on the go” measurements
- 1 MSamples Single Port memory for “oscilloscope like” measurements
- Programmable hardware averaging
- Programmable sampling frequency
- Voltage or current measurement mode
- 2 current full scales: ±100µA and ±500µA
- 2 voltage full scales ±1.2V and ±12V
- Single shot or append trigger modes
- Programmable measurement burst length
THE VOLTAGE/CURRENT SOURCES
Each instrument has 2 parallel Voltage Sources and 2 parallel Current Sources that can be shared among all channels. These sources provides:
- 16 Bit resolution
- ±10V voltage range
- 2 current full scales: ±50µA, ±500µA
- Fast update rate: > 1MSps
- Fast settling time: 10µs to 0.003%
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