Overview

 

 

Active Technologies provides a new high performance instrument series in a very compact and robust 1U 19” Rack Mount format.
Up to 8 instruments can be linked together and synchronized through the AT-XSS expansion bus to make a complete integrated very high performance test system.
A 1U embedded PC provides overall system control and reliable data processing and collection.

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The Rack Mount series includes:

 

 

 



AT-LA500 - 500MS/s Logic Analyzer

  • 36 Channel @ 500MS/s
  • GigaView: 36 Channels @ 1.5GS/s
  • 500MHz Timing Analysis, 200MHz State Analysis
  • 31 Trigger Levels
  • 2 Million Samples per Channel
  • Oscilloscope Integration for Mixed Signal Analysis
  • 4 Independent Programmable Thresholds
  • Pattern Generation-Acquisition:
    - 36 Channels @ 125MHz Generation, 250MHz Acquisition
    - Digital Waveform Sequencer
    - 640 Vectors in Generation, 2 Million Vectors in Acquisition
    - 2 Bank Programmable Directions
    - Programmable Event Detector
    - Parallel 1, 2 or 4 wire Serial Operating Modes

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AT-AWG4000 – 4 Channel 1Gs/s 16 Bit Arbitrary Waveform Generator

4 Channels, 16 Bit, 1Gs/s Waveforms

  • 2 Million Samples per Channel
  • 16 Bits (n)ASK, (n)QAM, (n)PSK/FSK, PWM Modulations
  • Per Channel Waveform Sequencer
  • True Arbitrary and 36 Bit DDS Modes
  • Inter-Channel Math Operations: Sum, Difference, Multiply
  • Digital Pattern Output
  • 100MHz Sine Waveforms
  • Triangular, Square, Pulse, Ramp, Noise, DC Waveforms
  • Pattern Generation-Acquisition:
    - 36 Channels @ 125MHz with Per Bit Programmable Direction
    - 36 Channels @ 250MHz with Fixed Direction
    - 1Million Vectors in Generation, 1Million Vectors in Acquisition
    - Digital Waveform Sequencer
    - Parallel 1, 2 or 4 wire Serial Operating Modes
    - 31 Levels Programmable Event Detector
    - 2 Bank Programmable I/O Levels

AT-AWG PWR – High Current Wideband 1Gs/s 16 Bit Arbitrary Waveform Generator

  • High Output Current: 600mA Continuous, 3A Peak
  • Unlimited Capacitive Load Drive Capabilities
  • High Slew Rate: < 400ns Rise Time @ 100nF Capacitive Load
  • ±8V Output Swing @ 600mA Load, ±10V @ Open Output
  • High Frequency Noise Generation at DUT Power Supply Lines
  • 16 Bit, 1Gs/s Waveforms
  • 2 Million Samples
  • Waveform Sequencer

AT-PMU – 16 Channel High Performance Programmable Measurement Unit

  • Bench-Top Use for up to 16 Parallel I-V Characterization
  • Advanced Use for Complex Device Characterization
  • Integrated 16 Inputs, 16 Outputs High Speed Low Parasitic Switch Matrix
  • Flexible Per Pin Programmable Switch Matrix Configuration
  • 2 to 8 Parallel I-V Measurement Units with Per Channel Independent:
    - 12 Bit or 14 Bit Measurement Resolution
    - 65 MS/s Measurement Sampling Rate
    - 2 Current Ranges: ±100µA and ±500µA
    - 2 Voltage Ranges: ±1.2V and ±12V
    - 1 Million Samples for “Oscilloscope Like” acquisitions
    - 2K Samples Dual Port Memory for “On The Go” acquisitions
    - Programmable Hardware Averages
    - Programmable Voltage-Current Measurement Mode
  • 2 Parallel Voltage Sources: ±10V Range, 16 Bit Resolution
  • 2 Parallel Current Sources: ±50µA, ±500µA Range, 16 Bit Resolution

 

 
 

 

 

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