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Active Technologies provides a new high performance instrument series in a very compact and robust 1U 19” Rack Mount format.
Up to 8 instruments can be linked together and synchronized through the AT-XSS expansion bus to make a complete integrated very high performance test system.
A 1U embedded PC provides overall system control and reliable data processing and collection.

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The Rack Mount series includes:
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AT-LA500 - 500MS/s Logic Analyzer
- 36 Channel @ 500MS/s
- GigaView: 36 Channels @ 1.5GS/s
- 500MHz Timing Analysis, 200MHz State Analysis
- 31 Trigger Levels
- 2 Million Samples per Channel
- Oscilloscope Integration for Mixed Signal Analysis
- 4 Independent Programmable Thresholds
- Pattern Generation-Acquisition:
- 36 Channels @ 125MHz Generation, 250MHz Acquisition
- Digital Waveform Sequencer
- 640 Vectors in Generation, 2 Million Vectors in Acquisition
- 2 Bank Programmable Directions
- Programmable Event Detector
- Parallel 1, 2 or 4 wire Serial Operating Modes
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AT-AWG4000 – 4 Channel 1Gs/s 16 Bit Arbitrary Waveform Generator
4 Channels, 16 Bit, 1Gs/s Waveforms
- 2 Million Samples per Channel
- 16 Bits (n)ASK, (n)QAM, (n)PSK/FSK, PWM Modulations
- Per Channel Waveform Sequencer
- True Arbitrary and 36 Bit DDS Modes
- Inter-Channel Math Operations: Sum, Difference, Multiply
- Digital Pattern Output
- 100MHz Sine Waveforms
- Triangular, Square, Pulse, Ramp, Noise, DC Waveforms
- Pattern Generation-Acquisition:
- 36 Channels @ 125MHz with Per Bit Programmable Direction
- 36 Channels @ 250MHz with Fixed Direction
- 1Million Vectors in Generation, 1Million Vectors in Acquisition
- Digital Waveform Sequencer
- Parallel 1, 2 or 4 wire Serial Operating Modes
- 31 Levels Programmable Event Detector
- 2 Bank Programmable I/O Levels
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AT-AWG PWR – High Current Wideband 1Gs/s 16 Bit Arbitrary Waveform Generator
- High Output Current: 600mA Continuous, 3A Peak
- Unlimited Capacitive Load Drive Capabilities
- High Slew Rate: < 400ns Rise Time @ 100nF Capacitive Load
- ±8V Output Swing @ 600mA Load, ±10V @ Open Output
- High Frequency Noise Generation at DUT Power Supply Lines
- 16 Bit, 1Gs/s Waveforms
- 2 Million Samples
- Waveform Sequencer
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AT-PMU – 16 Channel High Performance Programmable Measurement Unit
- Bench-Top Use for up to 16 Parallel I-V Characterization
- Advanced Use for Complex Device Characterization
- Integrated 16 Inputs, 16 Outputs High Speed Low Parasitic Switch Matrix
- Flexible Per Pin Programmable Switch Matrix Configuration
- 2 to 8 Parallel I-V Measurement Units with Per Channel Independent:
- 12 Bit or 14 Bit Measurement Resolution
- 65 MS/s Measurement Sampling Rate
- 2 Current Ranges: ±100µA and ±500µA
- 2 Voltage Ranges: ±1.2V and ±12V
- 1 Million Samples for “Oscilloscope Like” acquisitions
- 2K Samples Dual Port Memory for “On The Go” acquisitions
- Programmable Hardware Averages
- Programmable Voltage-Current Measurement Mode
- 2 Parallel Voltage Sources: ±10V Range, 16 Bit Resolution
- 2 Parallel Current Sources: ±50µA, ±500µA Range, 16 Bit Resolution
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