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RIFLE
is a dedicated instrument designed for non volatile memory
characterization. RIFLE combines high performances of commercial
A.T.E with the flexibility required for advanced research
activities.
Any kind of operation (maps, distributions, IV-characteristics,
cycling, ...) can be performed in a completely graphical and
user-friendly environment, with just a mouse click. Any kind
of complex analysis can be carried out in extremely short
times, without moving from your desk.
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Application
Areas
RIFLE has been developed for deep investigation of
the behaviour and reliability of non-volatile memory cells and arrays.
Its easy-to-use and easy-to-program interface, together with a dedicated
high performance measurement engine, enables its application in
a wide range of operations, during technology and product development
and during the life-time of the memory devices.
The following diagram shows the various development phases where
RIFLE is currently applied.
Technology
and Product Development
Cell
Level Reliability Studies
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- Cell
level measurements and characterization (IV, Vt)
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- Single cell cycling
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- Algorithm trials (pulse waveforms, lengths, …)
Matrix
Level Reliability Studies
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- Matrix
level measurements and characterization (distributions, maps,
subset identifications)
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- Full or partial matrix cycling
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- Algorithm trials (program and erase, simulating P/E controller)
Product
Debug
-
- Functional
verification (matrix + interface)
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- Product characterization (distributions, maps, subset identifications)
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- ull or partial matrix cycling using embedded controller
Product
Qualification
- Failure
analysis
- Interactive investigations
Manufacturing
and Product Life-Time
Process
Control
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- Functional
and reliability analysis on test structures
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- Matrix level measurements and characterization (distributions,
maps, subset identifications)
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- Full or partial matrix cycling
Product
Quality Control
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- Functional
and reliability analysis on products
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- Product characterization (distributions, maps, subset identifications)
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- Full or partial matrix cycling using embedded controller
Failure
Analysis
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- Understanding
failures coming from the testing or from Quality Control
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- Interactive investigations
Field
Return Analysis
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- Understanding
failures coming from field applications
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- Interactive investigations
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