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Based on the great success of the RIFLE test equipment about the greatest European memory manufacturers (Infineon Flash, ST, Saifun, IMEC) the new high performance RIFLE-SE system has been developed for the testing of single cell, stand alone or embedded avant-garde non volatile memories (NAND/NOR standard flash, multilevel, dual bit, PCM).
RIFLE-SE has a completely new architecture that improves both digital and analog performances by a 10x factor and adds new important features to expand its application area considerably diminishing the measurement times.
The Rife-SE has an improved user interface, completely graphic, where complex analysis can be carried out and displayed with just few mouse clicks.
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Application
Areas
RIFLE-SE has been developed for deep investigation of
the behaviour and reliability of non-volatile memory cells and arrays.
Its easy-to-use and easy-to-program interface, together with a dedicated
high performance measurement engine, enables its application in
a wide range of operations, during technology and product development
and during the life-time of the memory devices.
The following diagram shows the various development phases where
RIFLE-SE is currently applied.
Technology
and Product Development
Cell
Level Reliability Studies
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Cell
level measurements and characterization (IV, Vt)
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Single cell cycling
-
Algorithm trials (pulse waveforms, lengths, …)
Matrix
Level Reliability Studies
-
Matrix
level measurements and characterization (distributions, maps,
subset identifications)
-
Full or partial matrix cycling
-
Algorithm trials (program and erase, simulating P/E controller)
Product
Debug
-
Functional
verification (matrix + interface)
-
Product characterization (distributions, maps, subset identifications)
-
Full or partial matrix cycling using embedded controller
Product
Qualification
- Failure
analysis
- Interactive investigations
Manufacturing
and Product Life-Time
Process
Control
-
Functional
and reliability analysis on test structures
-
Matrix level measurements and characterization (distributions,
maps, subset identifications)
-
Full or partial matrix cycling
Product
Quality Control
-
Functional
and reliability analysis on products
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Product characterization (distributions, maps, subset identifications)
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Full or partial matrix cycling using embedded controller
Failure
Analysis
Field
Return Analysis
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