• 36 Channels @ 500MS/s
• GigaView: 36 Channels@1.5 GHz (666 ps)
• Connect up to 8 instruments with AT-XSS bus
• 500 MHz Timing Analysis
• 200 MHz DDR / 100 MHz SDR State Analysis
• Up to 4 Million Samples on all channels
• Up to 130 min. of acquisition time
• Pattern and edge triggering
• 31 Trigger Levels
• 3 probe sets hot pluggable
• 4 programmable and independent thresholds on each instrument
• 1 Meter length probe
• Wide Voltage input range: -40V to 40V with Active HiZ Probe
• USB 2.0 interface (also supports USB 1.1)
• Windows 2000/XP/Vista/Seven/10 –  32/64 Bit OS

• Easy to use interface
• 3 Available Display Windows: Waveform Window, Data Window and DAC Window
• Unlimited number of Display Windows opened simultaneously
• Export trace data to other Windows applications
• Software Development Kit available

Mixed signal tests are always involved in electronic circuits were mixed signal components interact with digital devices or in digital circuits where signal integrity must be analyzed.

In mixed signal tests some additional features are required beyond bandwidth, sample rate and memory depth:

Channel count
Expandability
Trigger levels
Probe features
Analogue-digital synchronization

Many good oscilloscopes or mixed signal oscilloscopes are available at a very effective price. But as good are the performances of the analogue part as poor are those of the digital part which usually is not adequate for professional tests.

AT-LA500 is a professional logic analyzer that can be tightly integrated with a standard oscilloscope providing the best mixed signal solution both in term of performance and price.

New MSO Capability FREE on your Next DPO7000 Series Oscilloscope

Tektronix partnering with Active Technologies in Italy, now offer an integrated high performance Mixed Signal capability for the DPO7000 series Oscilloscopes Active Technologies, AT-LA500, USB based logic analyzers, have been customized to work with the DPO7000 series Oscilloscope range. This customization provides a integrated capability for the Windows performance MSO market.

AT-LA500 Mixed Signal Test Solution

AT-LA500 completes a standard oscilloscope providing all the digital features required to carry out any mixed signal test situation:

• High sampling rate: 500Msps timing analysis, 200Mhz DDR state analysis
• GigaView: 1.5 GHz (666 ps-resolution) timing acquisition on all channels
• Channel expandability: from 36 up to 288 channels
• 32 trigger levels
• 3 different set of probes with:
• high bandwidth
• multiple independent programmable thresholds
• very uncommon input impedance as high as 1MOhm
• Up to 4 Million Samples on all channels
• Serial Protocol Analysis

AT-LA500 can be easily and efficiently integrated with a standard oscilloscope thanks to its very compact size and the USB connection to the oscilloscope itself (if it is windows based) or a PC where both the oscilloscope and the logic analyzer can be controlled and the acquired digital/analogue signals managed and displayed together.

Synchronization

AT-LA500 provides a dedicated expansion bus, called AT-XSS, for expandability and synchronization with external instruments (i.e. oscilloscopes). The synchronization is bidirectional so that the oscilloscope and the logic analyzer can be in turn the trigger master. Only two BNC cable must be connected between the two instruments to make the new mixed signal tester.

Mixed signal waveform window

The integration is also powered by the software interface that hides all the communication details between the AT-LA500 and the oscilloscope. The system configuration interface is very intuitive but powerful at the same time. Mixed analog/digital acquisitions can be displayed in the advanced mixed signal waveform window which provides:

• Simultaneous display of multiple analogue / digital traces
• Independent trace size, zooming and properties
• Analog representation of digital busses
• Add, remove, drag & drop signals
• Expand and collapse busses
• Advanced pattern/edge searches

Supported oscilloscopes
AT-LA500 supports connection with most popular oscilloscope on the market.
The supported oscilloscopes are growing, but if your model isn’t in the list, please write us an e-mail info@activetechnologies.it

Tektronix

All Windows-based instruments in the following families:

DPO 7000 Series Oscilloscopes
DPO 70000 Series Oscilloscopes
TDS7054, TDS7254, TDS7404, TDS5054, TDS5104, TDS7104, TDS6604, TDS7154, CSA7404, TDS6404, CSA7404B, TDS7154B, TDS7254B, TDS7404B, TDS7704B, TDS5054B, TDS5104B, TDS5032B, TDS5052B, TDS5054BE, TDS5034B, TDS6804B, TDS6604B, TDS6154C, TDS6124C, DPO7054, DPO7104, DPO7254, DPO70404, DPO70604, DPO70804, DSA70404, DSA70604, DSA70804, DPO7354, DPO71254, DPO71604, DPO72004, DSA71254, DSA71604, DSA72004, DPO70404B, DPO70604B, DPO70804B, DPO71254B, DPO71604B, DPO72004B, DSA70404B, DSA70604B, DSA70804B, DSA71254B, DSA71604B, DSA72004B

LeCroy

All Windows-based instruments in the following families:

WaveRunner 6K and WaveRunner Xi series
WavePro 7K and 700Zi series
WaveSurfer 400 and WaveSurfer Xs series
WaveMaster

Nowadays digital devices have become more complex, more sensitive to signal quality and harder to debug including high-frequency buses and high speed logic families.

Debugging digital hardware can be a difficult and long operation because new effects caused by fast edges like logic errors, crosstalk, ground bounce and power distribution artifacts can occur.
Timing error debugging includes the characterization of the following problems:

• Glitches
• Setup/Hold Violations
• Timing Margin Verification
• Crosstalk/ Jitter Analysis

Thanks to the GigaView technology the AT-LA500 is capable of performing timing error debugging despite of general purpose logic analyzers that are traditionally unable to perform such kind of analysis. The GigaView technology provides a 2ns timing resolution with up to 4 MSamples depth simultaneously with a 666 ps high resolution timing within the same acquisition and using the same probes.
It is like performing two analysis in one: a deep timing analysis and an additional high-resolution timing analysis.

Glitches
Glithches are usually very narrow pulses that can be very difficult to detect, capture and hard to resolve. Their effect are often unpredictable and they can be the first sign of device faults like driver errors, timing violations and crosstalk.

AT-LA500 deep timing signal waveform ( 2ns resolution and up to 4 MSamples memory depth) can examine all the signal lines of the bus at once and look for events or faults; after a particular event, like a glitch, has been detected, the GigaView waveforms can display all the channels in high resolution (666 ps) with 1024 samples depth per channel, providing the way to examine the event in detail.
GigaView high-resolution timing window is able to reveal glitches and to measure their duration with high accuracy.

Setup/Hold Violations

Setup/Hold parameter is a common source of digital system errors and its analysis can be difficult with the traditional approach of probing a clock and a data line using a oscilloscope.

The logic analyzer approach can monitor simultaneously every signal in the system for detecting setup/hold violations and when a problem is discovered in a particular time window, the AT-LA500 GigaView can measure in that window setup/hold times with an accuracy of 666 ps.

Timing Margin Verification
666 ps resolution on all channels with a maximum skew of 666 ps from channel to channel, allows designers to move from simply troubleshooting apparent problems to actually verifying the timing margins of their designs. Sample points can be moved in 666 ps increments to precisely determine setup-and-hold windows and examine the behavior of clocks, data and address lines with respect to each other, and asynchronous inputs.

AT-LA500 can be configured to work as a powerful pattern generator-sampler. In this working mode AT-LA500 provides the capability to emulate standard serial or parallel bus transactions or custom digital interfaces for system or device debugging and characterization.
Its architecture is based on a vector/command memory and a powerful sequencer that defines the vector/command execution flow.

As pattern generator-sampler AT-LA500 provides:

• 125MHz generation rate, 250MHz acquisition rate
• 2Msample acquisition memory
• 640 vector/commands and 512 sequencer instructions
• 36 Bits with 2 independent directions
• Parallel or 1, 2 or 4 wire serial operating mode
• Conditional or unconditional execution flow/
• rogrammable edge/level event detector
• Programmable clock generator
• Programmable sampling frequency
• Multi-device synchronization with AT-XSS

Digital waveforms (vectors and commands) can be edited in tabular format or by means of a powerful and very intuitive digital waveform editor that provides tools for advanced pattern definitions: clock, count and random patterns over a selection or the entire signal or bus.

The execution flow of the edited waveforms can be easily defined with a dedicated sequencer editor form.

Thanks to a dedicated hardware the AT-LA500 serial protocol analyzer provides the most advanced triggering capabilities on the market.

A graphical user interface provides easy instrument setup and data analysis in graphical and tabular representations. Command interpretation is provided in both representation as well with cross probing features that allow to detect critical events very easily.

Supported protocols:

• RS 232
• I2C
• SPI
• Microwire
• 485
• 422
• UART

Probes

Active Technologies offers a wide range of probing options to support different measurement needs.

Active Hi-Z Probe: offers a linear input voltage range from -40V to +40V with 1.1MΩ of input resistance.

ASP Probe : offers a linear input voltage range from -38V to +38V with <10pF of input capacitance and 130 MHz of toggle rate.Passive Probe: offers a linear input voltage range from 0V to 5V with 2V fixed threshold4 Independent programmable thresholds allows you to test circuits with different logic families at the same time; 1 meter length probe cable provides an easy connection to boards under test even if they are far from the instrument